| Feature Category | Key Capabilities & Specifications | | :--- | :--- | | | Pin Scale 1600, Pin Scale 5000B cards handling speeds over 32 Gbps ; addresses AI, High-Performance Computing (HPC) and advanced digital devices. | | RF & Wireless Testing | Wave Scale RF, Wave Scale Millimeter cards. Covers 5G/6G (sub-6 GHz & mmWave up to 70 GHz), Wi-Fi 6E/7, Bluetooth, GPS, and Ultra-Wideband (UWB). | | Mixed-Signal & Power | AVI64 card provides a broad voltage range of -40V to +80V for precision analog testing; DC Scale cards manage currents from milliamps to over 1000A , critical for high-power AI processors and automotive ICs. | | System Architecture | Multi-site efficiency (MSE) up to 99.9% with configurations supporting over 1,024 independent test sites in parallel for massive production throughput. | | Scalability (Classes) | Full compatibility across all A-class (engineering) to L-class (high-volume) test heads, protecting your investment by allowing program and hardware reuse as your needs grow. |

D --> E[Load Test Program]; E --> F[Perform Calibration]; F --> G[Execute Multi-Site Test]; G --> H[Analyze Data & Generate Report]; H --> I[End: System Shutdown];

The workhorse digital card capable of driving speeds up to 1.6 Gbps per channel. It handles vector pattern generation, timing edge allocation, and formatting.

: Users can customize GUIs for setup, results, and debugging.

The legacy, file-based environment. It relies heavily on text files for configuration (ASCII files for pin maps, test flows, and levels) and uses C++ for writing test methods.

Operating the 93k tester requires mastery of Advantest's proprietary software suite, . Depending on the generation of your tester, you will interact with either SmarTest 7 or SmarTest 8. SmarTest 7 vs. SmarTest 8

A Test Suite is an individual testing block (e.g., a Continuity test or a IDD Leakage test). It ties together a specific set of Levels, Timing, Vector Patterns, and a Test Method. Test Flow Language (TFL)